Contracted services for scanning electron microscope observation | JTL
We will conduct surface morphology observation at high magnification using SEM/FE-SEM.
In the scanning electron microscope observation service, high-magnification morphological observation of the sample surface is conducted using SEM and FE-SEM. In SEM observation, it is possible to observe not only the surface roughness but also the distribution of composition and the state of crystalline particles. FE-SEM observation allows for higher magnification than scanning electron microscopy (SEM), and crystal orientation analysis using EBSD can also be performed. Additionally, elemental analysis can be conducted using EDX, which is attached to SEM/FE-SEM. At JTL, we also accept services related to necessary processes before and after observation and analysis using SEM/FE-SEM, such as evaluation tests, cross-section polishing, and dimensional measurements.
- Company：JAPAN TESTING LABORATORIES
- Price：Other
